@MastersThesis{Gonçalves:2016:EsInBo,
author = "Gon{\c{c}}alves, Rosana Alves",
title = "Estudo da incorpora{\c{c}}{\~a}o de boro em diamante micro- e
nano-cristalino por espectroscopia de fotoel{\'e}trons excitados
por raios-x (XPS)",
school = "Instituto Nacional de Pesquisas Espaciais (INPE)",
year = "2016",
address = "S{\~a}o Jos{\'e} dos Campos",
month = "2016-02-26",
keywords = "diamante, boro, diamond, boron, XPS.",
abstract = "Neste trabalho foram estudados os efeitos da
incorpora{\c{c}}{\~a}o de CH\$_{4}\$ e Ar na
incorpora{\c{c}}{\~a}o de boro em filmes de diamante micro e
nano-cristalino. Neste estudo foram analisadas dois diferentes
lotes de filmes de diamante, ambos crescidos sob substratos de
sil{\'{\i}}cio em reator de filamento quente atrav{\'e}s do
m{\'e}todo de deposi{\c{c}}{\~a}o de vapor qu{\'{\i}}mico (do
ingl{\^e}s, Chemical Vapour Deposition - CVD). O lote A {\'e}
constitu{\'{\i}}do por amostras com diferentes
concentra{\c{c}}{\~o}es de CH\$_{4}\$ (1, 3, 5 e 7\%)
enquanto o lote B {\'e} constitu{\'{\i}}do por amostras com
diferentes concentra{\c{c}}{\~o}es de Ar (0, 50, 60, 70 e
80\%). A caracteriza{\c{c}}{\~a}o morfol{\'o}gica e estrutural
foi realizada a partir de Microscopia Eletr{\^o}nica de Varredura
(MEV), Espectroscopia Raman e Difra{\c{c}}{\~a}o de Raios X. A
concentra{\c{c}}{\~a}o de boro foi estudada detalhadamente a
partir de medidas de Mott Schottky Plot nos filmes. A
incorpora{\c{c}}{\~a}o de boro foi estimada a partir de
Espectroscopia de Fotoel{\'e}trons Excitados por Raios X (XPS).
Medidas de XPS foram feitas nos modos azimutal e \emph{angle
resolved} (ARXPS). Os resultados mostram uma depend{\^e}ncia da
concentra{\c{c}}{\~a}o de boro com a varia{\c{c}}{\~a}o
angular nas medidas, indicando que o boro se encontra em
regi{\~o}es mais superficiais das amostras. Os dados obtidos
atrav{\'e}s dessa t{\'e}cnica indicam a redu{\c{c}}{\~a}o da
quantidade de boro em filmes com alta concentra{\c{c}}{\~a}o de
carbono sp\$^{2}\$ e pequeno tamanho de gr{\~a}o. Estes
resultados n{\~a}o est{\~a}o de acordo com a literatura. A
incorpora{\c{c}}{\~a}o de boro tem efeito mais pronunciado nas
amostras com varia{\c{c}}{\~a}o da concentra{\c{c}}{\~a}o de
CH\$_{4}\$. As mudan{\c{c}}as morfol{\'o}gicas e estruturais
dos filmes causadas pela varia{\c{c}}{\~a}o de CH\$_{4}\$ e Ar
corroboram os resultados apresentados na literatura. ABSTRACT: In
this work were studied the effects of the concentration of
CH\$_{4}\$ and Ar in the boron incorporation into micro- and
nano-crystalline diamond films. In this study were analyzed two
different lots of diamond films, both grown on silicon substrates
in hot filament reactor by the method of Chemical Vapour
Deposition (CVD). Lot A was composed of samples with different
concentrations of CH\$_{4}\$ (1, 3, 5 and 7\%) while the lot B
was constituted by samples with different concentrations Ar (0,
50, 60, 70 and 80\%). The morphological and structural
characterization was performed from Scanning Electron Microscopy
(SEM), Raman spectroscopy and X-ray Diffraction. The boron
concentration was studied in detail from of measures of Mott
Schottky Plot on the films. The boron incorporation was estimated
from X-ray Photoelectron Spectroscopy. XPS measurements we are
carried out in azimutal and angle resolved (ARXPS) mode. The
results shown a dependency of boron concentration with variation
angular in the measurements, indicating that boron is in the more
superficial regions of the samples. The data obtained using this
technique indicate the reduction of the amount of boron in films
with high concentration of sp\$^{2}\$ carbon and small grain
size. This results are not in agreement with the literature. The
incorporation of boron has more pronounced effect for the samples
with variation of concentration of CH\$_{4}\$. The morphological
and structural changes in the film caused by the variation of
CH\$_{4}\$ and Ar were corroborated by the results presented in
the literature.",
committee = "Baldan, Maur{\'{\i}}cio Ribeiro (presidente/orientador) and
Ferreira, Neiden{\^e}i Gomes and Matsushima, Jorge Tadao",
copyholder = "SID/SCD",
englishtitle = "Study of the incorporation of boron in diamond micro- and
nano-crystalline by x-ray photoelectron spectroscopy (XSP)",
language = "pt",
pages = "143",
ibi = "8JMKD3MGP3W34P/3L68LDS",
url = "http://urlib.net/ibi/8JMKD3MGP3W34P/3L68LDS",
targetfile = "publicacao.pdf",
urlaccessdate = "27 abr. 2024"
}